Capacitance Meters, up to 1 MHz
C HiTESTER 3504
- Capacitance testing with voltage dependency characteristics through the use of constant voltage testing (CV).
- Detect contact failure on all 4 terminals for increased reliability.
- High speed inspection of Multi-Layer Ceramic Capacitors (MLCC) on taping machines.
- C, D (tan δ), large capacitance MLCC testing.
- 120Hz or 1kHz.
- 2 ms test speed, ±0.09% accuracy.
C METER 3506-10
- High speed testing of ceramic capacitors on production lines.
- Integrate with automatic taping machines and sorters for production of MLCC (multi-layer ceramic capacitors).
- C, D, (tan δ), Q, low capacitance testing.
- 1 kHz or 1 MHz.
- 1.5 ms test speed (1MHz), ±0.14% accuracy.
Impedance Analyzers, up to 3 GHz
IMPEDANCE ANALYZER IM3570
- Superior low-impedance repeatability.
- Meet applications in low-ESR measurement.
- |Z|, L, C, R testing.
- 4 Hz to 5 MHz.
- 0.5 ms test speed, ±0.08% accuracy.
- Single device solution for high speed testing and frequency sweeping.
EQUIVALENT CIRCUIT ANALYSIS FIRMWARE IM9000
- Conduct simple circuit analysis & detailed acceptance/rejection decision-making for impedance analysis of advanced electrochemical components.
- Optional software upgrade for Model IM3570.
- 5 equivalent circuit models.
- Compute ideal frequency characteristics and compare to measured values.
- Cole-Cole plot, admittance circle display.
CHEMICAL IMPEDANCE ANALYZER IM3590
- For R&D of electrochemical components & materials, batteries, & EDLCs.
- Measure ion behavior & solution resistance.
- LCR impedance testing for Cole-Cole plots & equivalent-circuit analyses.
- |Z|, L, C, R, σ, ε testing.
- Battery testing function.
- 1 mHz to 200 kHz.
- 2 ms test speed, ±0.05% accuracy.
IMPEDANCE ANALYZER IM7583
- For high volume production of ferrite chip beads and chip inductors.
- Comprehensive contact check via DCR testing, Hi-Z reject or waveform judgment.
- |Z|, L, C, R testing.
- 1MHz to 600MHz.
- 0.5ms test speed, ±0.65% accuracy.
- Measure LCR and conduct frequency sweeps simultaneously.
IMPEDANCE ANALYZER IM7585
- For R&D and high volume production of ferrite chip beads and chip inductors.
- Comparator and Contact Check.
- |Z|, L, C, R testing.
- 1MHz to 1.3GHz.
- 0.5ms test speed, ±0.65% accuracy, 0.07% variability.
- Measure LCR and conduct frequency sweeps simultaneously.
LCR Meters, up to 8 MHz
LCR HiTESTER 3511-50
- Integrate into automated production lines.
- On-board testing of capacitors and coils.
- |Z|, L, C, R testing.
- 120 Hz or 1 kHz.
- 5 ms test speed, ±0.08% accuracy.
- High-speed comparator.
LCR METER IM3533
- Built-in low impedance high precision mode for testing low inductance or ESR of aluminum electrolysis capacitance.
- Turn ratio, mutual inductance and inductance difference measurements of transformers and coils.
- |Z|, L, C, R testing.
- 1 mHz to 200 kHz.
- 2 ms test speed, ±0.05% accuracy.
- Transformer measurement mode.
LCR METER IM3523
- Economical LCR Meter designed for production lines.
- Continuous testing over mixed measurement conditions, including C-D(120 Hz) and ESR(100 kHz).
- Comparator and BIN functions.
- |Z|, L, C, R testing.
- 40 Hz to 200 kHz.
- 2 ms test speed, ±0.05% accuracy.
- Comparator and BIN functions.
LCR METER IM3536
- Industry-standard LCR meter meeting the widest range of applications.
- |Z|, L, C, R testing.
- DC, or 4 Hz to 8 MHz (up to 10MHz special order available).
- 0.5 ms test speed, ±0.05% accuracy.
- Accuracy guaranteed range from 1 mΩ.
Test fixture or Probes
PINCHER PROBE L2001
- 2-wire probe for LCR testing of small chip components.
- DC to 8MHz, 50Ω termination.
- Tip electrode spacing: 0.3 to 6 mm.
- Measurable sample size: 0603 (EIA).
SMD TEST FIXTURE IM9100
- High-precision 4-wire testing of advanced electronic components.
- Direct-connection testing.
- Test SMDs with electrodes on the bottom.
- DC to 8MHz.
- Measurable sample sizes: 01005 to 0402 (EIA).
SMD TEST FIXTURE IM9110
- High-precision two-wire fixture.
- High reproducibility with advanced contact technology.
- For direct connection two-wire testing.
- DC to 1 MHz.
- Measurable sample size: 008004 (EIA).
SMD TEST FIXTURE IM9201
- Test fixture for IM7580 series Impedance Analyzers.
- High frequency analysis.
- For direct connection two-wire testing.
- DC to 3 GHz.
- 6 measurable sample sizes: 0201 to 1210 (EIA).
TEST FIXTURE IM9202
- Flexible Staging Mechanism Supports a Diverse Range of Component Shapes and Sizes.
- Test fixture for IMPEDANCE ANALYZER IM7580 series.
- High frequency testing up to 600 MHz.
- Properly identify SRF and ESR to validate component performance.
