Application Software

• FAIL VISUALIZER   UA1782

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  • Pattern visualizing software for both ICT and bare board testers.
  • Search for components and nets on device embedded substrates.
  • Dedicated visualization software for Hioki electrical testing equipment and data creation systems.

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• FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

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  • Gerber data editing software that embodies the know-how for substrate testing.
  • Reduce data generation time by 50% with new platform.
  • 3-in-1 for editing, test-point generation, and built-in component support.
  • New Windows-optimized algorithm.
  • Free from data volume restrictions for increased freedom.
  • Added new commands to reduce data generation time by half.

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• FIT-LINE INSPECTION DATA CREATION SYSTEM   UA1780

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  • Optimize testing performance when paired with the FA1240-50 Flying Probe Tester.
  • Generate high-quality board testing data without physical boards.

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