Bare board/Package Testing Populated Board Testing


  • Application Software


    FIT-LINE INSPECTION DATA CREATION SYSTEM   UA1780

    • Optimize testing performance when paired with the FA1240-50 Flying Probe Tester.
    • Generate high-quality board testing data without physical boards.

    FAIL VISUALIZER   UA1782

    • Pattern visualizing software for both ICT and bare board testers.
    • Search for components and nets on device embedded substrates.
    • Dedicated visualization software for Hioki electrical testing equipment and data creation systems.

    FEB-LINE INSPECTION DATA CREATION SYSTEM   UA1781

    • Gerber data editing software that embodies the know-how for substrate testing.
    • Reduce data generation time by 50% with new platform.
    • 3-in-1 for editing, test-point generation, and built-in component support.
    • New Windows-optimized algorithm.
    • Free from data volume restrictions for increased freedom.
    • Added new commands to reduce data generation time by half.

  • Bare Board Testing (flying probe tester)


    FLYING PROBE TESTER   FA1283

    • Horizontal-loading double-sided flying probe tester.
    • Inspection from general bare boards to fine and high density substrates such as flexible substrates and CSP.
    • 4 arms, max. 100 points/sec.
    • Minimum 15 μm × 15 μm probing precision.

    FLYING PROBE TESTER   FA1811

    • Flying probe test for package board testing.
    • Achieve both high precision contact and high-speed probing.
    • Double test method delivers an operation rate of 100%.
    • 2 arms, supports test fixture.
    • 10 μm × 10 μm probing precision.
    • 40 μm minimum pitch.

    FLYING PROBE TESTER   FA1817

    • Vertical double-sided flying probe tester for bare board inspections.
    • Open via defect detection with low resistance measurement.
    • Detect pattern shape abnormality and voids with super insulation resistance testing.
    • 4 arms, max. 67 points/sec.
    • 20 μm × 20 μm probing precision.
    • 50 μm minimum pitch.

    FLYING PROBE TESTER   FA1816

    • Horizontal-loading single-sided flying probe bare board inspection tool.
    • High-speed pattern testing using the capacitive measurement method.
    • 2 arms, max. 100 points/sec.
    • 16 μm × 16 μm probing precision.
    • 50 μm minimum pitch.

  • Bare Board Testing with test fixture


    BARE BOARD HiTESTER   1230

    • All-in-one solution for testing the reliability of connections on printed circuit boards.
    • Emdedded passives/actives test.
    • HDI via resistance.
    • Known-good reference values for wiring pattern resistance.

    BARE BOARD TESTER   1232

    • High-precision batch fixture-type testing system that support boards with embedded passive and active devices.
    • Double-sided alignment.
    • 340 × 330 mm working area.

  • Populated Board Testing


    IN-CIRCUIT HiTESTER   1220

    • High performance populated board tester with expansion capabilities.
    • 4-wire resistance testing.
    • High-current/high-voltage diode testing.
    • High-speed testing of multi-board layouts.

    FLYING PROBE TESTER   FA1240-6x

    • High-speed 4-wire resistance testing of populated boards.
    • Quickly complete programs that take into account component height.
    • 4 arms, high-speed testing at up to 0.025 sec./step.
    • 510 × 460 mm testing area.
    • Automatic calculation of arm interference.

    SHORT-OPEN TESTER   FA1221

    • Multichannel short/open 4-wire test equipment for inspecting populated boards.
    • Specifically designed for short/open testing.
    • 4-wire resistance testing.

    IN-CIRCUIT TESTER   FA1220

    • High-speed, multichannel testing of populated boards.
    • Extensive function testing.
    • Macro-testing function to increase test efficiency.
    • 4-wire resistance testing.

  • The Power to Connect


    ATE Concept   The Power to Connect

    • Continuing to create new solutions together.