Showing all 5 results
Test fixture or Probes
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PINCHER PROBE L2001
- 2-wire probe for LCR testing of small chip components.
- DC to 8MHz, 50Ω termination.
- Tip electrode spacing: 0.3 to 6 mm.
- Measurable sample size: 0603 (EIA).
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SMD TEST FIXTURE IM9100
- High-precision 4-wire testing of advanced electronic components.
- Direct-connection testing.
- Test SMDs with electrodes on the bottom.
- DC to 8MHz.
- Measurable sample sizes: 01005 to 0402 (EIA).
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SMD TEST FIXTURE IM9110
- High-precision two-wire fixture.
- High reproducibility with advanced contact technology.
- For direct connection two-wire testing.
- DC to 1 MHz.
- Measurable sample size: 008004 (EIA).
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SMD TEST FIXTURE IM9201
- Test fixture for IM7580 series Impedance Analyzers.
- High frequency analysis.
- For direct connection two-wire testing.
- DC to 3 GHz.
- 6 measurable sample sizes: 0201 to 1210 (EIA).
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TEST FIXTURE IM9202
- Flexible Staging Mechanism Supports a Diverse Range of Component Shapes and Sizes.
- Test fixture for IMPEDANCE ANALYZER IM7580 series.
- High frequency testing up to 600 MHz.
- Properly identify SRF and ESR to validate component performance.